1. Skip to Menu
  2. Skip to Content
  3. Skip to Footer

FLash Programming

Joint Test Action Group (JTAG) is the common name for the IEEE 1149.1 Standard Test Access Port and Boundary-Scan Architecture. It was initially devised for testing printed circuit boards using boundary scan and is still widely used for this application.

Today JTAG is also widely used for IC debug ports. In the embedded processor market, essentially all modern processors implement JTAG when they have enough pins. Embedded systems development relies on debuggers communicating with chips with JTAG to perform operations like single stepping and breakpointing.

  • In-System Flash Programming Support
  • Automated generation of Flash Applications

For the unique automated generation of flash memory in-system programming application, JTAG Technologies offers the extensive FlashLib® which supports more than 3500 device types of flash memories, parallel EEPROM and parallel nvSRAM, MRAM and FRAM devices of the following suppliers:

Flash Memories

AMD Intel Sharp
AMIC Macronix Spansion
Atmel Micron SST
Catalyst NEC ST Microelectronics
Eon Numonyx Toshiba
Excel Renesas White
Fujitsu Samsung Winbond
Hynix Sanyo Xilinx


NOR Flash based MCP

AMD                       msystems             Spansion
Atmel NEC SST
Fujitsu

Numonyx

ST Microelectronics
HMP Renesas Toshiba
Intel Samsung White
ISSI Sharp  
Macronix Silicon7  


Parallel EEPROM

Atmel Intersil SST
Austin Renesas  Xicor
Catalyst Sanyo  


EEPROM based MCP

3DPlus

Austin

 Maxwell


Parallel nvSRAM

Dallas Semiconductor STMicroelectronics ZMD
Simtek Xicor Cypress

MRAM

Everspin

 Freescale  

FRAM

Fujitsu  Ramtron  

mDOC (DiskOnChip)

msystems

SanDisk